October 2012 – June 2016 Lecturer , Waterford Institute of Technology.
October 2004 – June 2012 Lecturer (Part time), Waterford Institute of Technology.
Subject | Level (year) | Course |
Electronics & Control | 2 | H C in Engineering in Mechanical Engineering |
Process Control (control theory) |
4 | BSc (Hon )in Manufacturing Engineering (ACCS) |
Process Control (statistical control, quality, sampling, design of experiments) |
3 | BEng. in Manufacturing Engineering (ACCS) |
Mechanical Technology | 1 | HC in Manufacturing Technology (ACCS) |
Solid Works Drawing | 1 | BEng (H) in Mechanical & Manufacturing Engineering |
Introductory Calculus | 1 | Higher Cert. In Building Services |
Computer Integrated Manufacture (CIM) | 4 | BSc Manufacturing Engineering. |
Process Technology | 4 | BSc Manufacturing Engineering |
Mathematical Methods | 2 | HCert in Mechanical/ production Engineering |
Calculus | 2 |
H Cert in Mechanical/ production Engineering H Cert in Building Services |
Calculus | 1 | H Cert in Building Services |
Differential Equations | 3 | BEng. Manufacturing Engineering. (ACCS) |
Computer Aided Engineering (combined FEA and CIM) |
4 | BSc (Hon ) in Manufacturing Engineering |
Project supervision |
3 4 4 |
BEng. In Manufacturing Engineering BEng(Hon) in Mchanical & Manufacturing Engineering BSc Manufacturing Engineering. |
SPECIALIST AREAS
Mathematics: Calculus and Mathematical Methods (matrices, series, regression, statistics, probability)
Process Control:Statistical process control, quality control, sampling theory etc.
Manufacturing: manufacturing layout, agile manufacturing, manned cellular manufacture, teams.
Mechanical Design: Finite Element Analysis; Design Analysis (uncertainty analysis, including mathematical modeling of uncertainty propagation mechanisms and error budgeting); Design of experiments; 3D CAD.
Control: Control theory (open and closed loop theory), basic electronic control circuitry, LabView programming, MathLab system response modeling and analysis.
Metrology:Interferometry, positioning sensing, environmental monitoring and compensation, error mapping techniques.
Investigation into factors affecting precision positioning instruments with a view to standardisation of specifications, PhD Thesis No. 105, Waterford Institute of Technology, (2012).
( As a vehicle for this research, a 3D contouring instrument has been designed and characterized at WIT)
The Mechanical Design of a 3-Axis Nano-contouring Stage (Paper 1&2), both presented at the International Manufacturing Conference, Waterford (2007).
Development of a Flexure based component measurement instrument for use in a noisy environment: International Manufacturing Conference, Waterford (2007)
FEA Design Based Positioning and Nanometer Resolution in a Noisy Environment, proceedings of the 7th EUSPEN Conference, Bremen, Germany (2007).
Development of a Flexure Based Ball Bearing Measurement Instrument for use in Noisy Manufacturing environments, proceedings of the EUSPEN 6th international conference, Baden bei Wien, Vienna, Austria (2006).Reduction in thermally induced displacements in XY contouring stages through FEA inspired design, proceedings of the EUSPEN 5th international conference, Montpellier, France (2005).
Contouring at Nano Resolution, posters presented at the IRCSET symposium, Cork (2004), Dublin Castle (2005).
Movement at Nano-resolution in a Noisy Environment, presented at the International Manufacturing Conference, Limerick, 2004.